Used SEMICS Opus II #9284013 for sale

SEMICS Opus II is a high-end prober equipment designed for high performance testing and debugging of wafer-level devices. It has been designed with scalability, automation and high precision in mind. The prober system consists of a highly accurate fully automated probing stage, which is designed to measure small features with precision levels of up to 0.1 microns. The prober unit is equipped with a large number of advanced sensors for collecting data such as temperature, voltage, and optical signals. The prober machine also features a variety of precision measurement methods, such as electrical, optical, and thermal probing, as well as a whole array of dedicated equipment for automated micro-etching, laser etching, and CMP (chemical-mechanical polishing). All of these features are highly beneficial in wafer-level IC testing, helping to accurately reveal subtle design errors and device micro-structures. The prober tool is also capable of self-calibration and remote diagnostics. In this mode it can monitor and correct any self-induced errors, ensuring that all of its results remain highly accurate and repeatable. The automation aspect of the prober asset also allows for the rapid assessment of multiple wafers in parallel, significantly reducing the amount of time necessary for testing each wafer. In addition, the support of multiple DUT types makes Opus II ideal for a wide range of applications. SEMICS Opus II also has several advanced capabilities, such as the ability to integrate with other systems, such as automation equipment, allowing it to work in a variety of industry sectors. It also has an integrated data Analysis Suite, which provides extremely detailed and versatile analysis of device testing results. This allows for the sheer identification of any design flaws or failures from the start of the design process. Opus II is a highly advanced prober model, suitable for a wide range of applications. The capabilities of this equipment make it an excellent choice for IC engineering companies seeking to maximize the speed and precision of their wafer-level debugging processes.