Used SEMICS Opus II #9407065 for sale

SEMICS Opus II is a prober-tester that provides high throughput, fully automated manufacturing test solutions for advanced embedded semiconductor memory devices. It is designed to interface directly with mass test environments, allowing it to be used in-line as part of a Product-In-Wafer (PIW) or Fab-in-Fab (FIF) production flow. Opus II platform is built upon SEMICS advanced Kontron-based computing architecture and their modular design approach allows for the creation of specialized configurations for a wide variety of semiconductor manufacturing tests and applications. With its dual Core 2 Duo CPUs, SEMICS Opus II has enough power and capabilities to provide users with a reliable and robust solution for fully automated test stand operations. Opus II test stands come with a variety of features, such as probers with high accuracy automatic nozzles and in-line measurement and programmable automation. This allows users to quickly and accurately test devices, as well as carry out complex test routines and provide individual part-level test data. In addition, SEMICS Opus II prober-tester also comes with an intuitive user interface, designed for easy and fast operation. It can be used for wafer sorting and characterization as well as for final device testing, making it a great choice for both large and small production runs. Opus II also has the capability for parallel testing of multiple devices, which improves production throughput and reduces the time per unit. Furthermore, SEMICS Opus II has an integrated real-time defect management system, enabling users to detect and manage any potentially defective semiconductor devices they discover in their testing. This provides them with quick and reliable feedback on device performance, allowing them to make informed decisions and take corrective actions if necessary. Overall, Opus II prober-tester is a powerful and reliable test platform that provides a comprehensive set of features and advanced capabilities, making it an ideal choice for semiconductor manufacturing test applications.