Used SEMICS Opus III #9189020 for sale

SEMICS Opus III is a prober designed for the automatic testing of integrated circuits, with a high throughput and a fully automated feature set. It supports effective testing of VLSI devices from gemoetric layouts to electrical performance. Opus III features advanced pin synchronization for parallel access of multiple inputs or outputs, allowing large numbers of I/Os to be accessed simultaneously. This is further enhanced with the Multi Node Timing techniques that minimize test time and overheads. To ensure accurate inspection, SEMICS Opus III includes a 2D or 3D vectorized stage that efficiently applies the same alignment to test devices of different sizes. It also has an alignment control system that can be adjusted manually or automatically to compensate for device drift and works with different pitch and geometries. Opus III has a high data acquisition rate of approximately 2 million contacts per second over a WiFi / Ethernet connection, enabling fast test cycles with minimal test time. It also supports multiple measurements, including parameter measurement, high-speed monitoring, transmission line measurements, and source-measurement instrumentation. The prober is also equipped with a vacuum pin ejection system that operates via pressure or vacuum and a mini-drill system that can be used to drill through test board connections and perform shortening and opening operations. In addition to these features, SEMICS Opus III also provides a wide range of safety features, including built-in inertial monitoring, active-confinement with surround view vision, automatic tube and bail deflection protection, clear inner line surveillance, and shock-absorption. These features make Opus III an ideal prober for automated testing of VLSI devices. It can be used for both early phase laboratory testing as well as high-volume production testing and provides accurate and reliable results with minimal effort and time.