Used SEMICS Opus III #9285131 for sale

SEMICS Opus III
Manufacturer
SEMICS
Model
Opus III
ID: 9285131
Prober.
SEMICS Opus III (also known as the O3 prober) is a semiconductor wafer testing prober developed by SEMICS Inc. Opus III was designed with a modular architecture, allowing for easy scalability and customization to meet the requirements of any wafer testing environment. The O3 prober is an all-in-one wafer testing platform capable of testing wafers in any form, such as wedge, square, and through-hole. It is designed to support multiple test configurations, such as single wafer, multiple wafer, multi-die, or multiple lot testing. The O3 prober is equipped with a multi-stage load lock chamber for loading and unloading wafers, ensuring that each wafer is uniformly tested with accuracy and repeatability. The temperature of the load-lock chamber can be controlled from 0-400°C (the maximum temperature is dependent upon the material of the wafer). The device also includes a wafer mapper, which is designed to map the position of each die on multiple wafers for accurate positioning of wafers during the testing process. The prober has a powerful motor drive system that is capable of accurately positioning wafers and testing devices with a motion control accuracy of 1μm and velocity accuracy of 2μm/s. It is also equipped with a high-speed optical alignment system to ensure accurate and precise alignment of wafers during testing. For electrical testing, the O3 prober is equipped with multiple high-density I/O channels which are capable of testing up to 8 wafers simultaneously. It supports a variety of electrical test instruments, such as curve tracers, relays, switches, and logic analyzers. In addition, the O3 prober can be used for visual inspection and wafer leakage testing through its integrated camera system. Overall, the O3 prober is a powerful and reliable wafer testing platform that offers the highest performance and accuracy for wafer testing applications. It is equipped with the latest technologies to efficiently test a variety of semiconductor wafer types and configurations, and its modular design allows for easy scalability and customization.
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