Used SEMICS Opus III #9350492 for sale

SEMICS Opus III prober is a comprehensive and versatile semiconductor wafer testing system designed to execute wafer and device prober operations. It supports many different types of wafer tests including full wafer level production, wafer sort, engineering wafers, die sort, component and reliability tests. Opus III prober provides probing solutions for a wide range of wafer and device level applications including RF, analog, digital, and mixed-signal devices. The prober's design features a unique user-friendly interface providing a comprehensive library of tests and their associated parameters. It offers full wafer and device level programming from a single desktop PC, saving test operators' time debugging software and making modifications. This reduces the complexity of maintaining multiple devices during the test cycle and lets operators focus on testing and analysis. SEMICS Opus III prober has an expansive library of tests and measurements available to cover a variety of applications. These tests can detect, identify, and report up to 19 parameters including position, junction leakage, isolation leakage, junction capacitance, threshold voltage, and channel length measurements. It also provides integrated video-based die and die-recognition methods for scan testing. The scanning technology allows the prober to maximize test coverage yielding greater accuracy and better data accuracy in the process. Opus III prober is also equipped with a range of functionality that extends beyond wafer testing. It includes an open platform for hosting custom software and hardware plugins, enabling a greater level of customization and scalability. The prober also includes options for handling differing wafer sizes and pre-alignment tooling for quicker loading of wafers. SEMICS Opus III also boasts a series of advanced motion control systems that enable faster test operations and reduce motion artifacts for better accuracy. Other features of Opus III prober include software-based pass/fail analysis, integrated leak testing, and resistance testing for characterizing device features. It also comes with an API (application programming interface) for integration into existing test systems, as well as a flexible power upgrade options provide more in-depth reporting columns. Finally, the prober includes a range of advanced safety and security features, such as electromagnetic interference (EMI) protection and data security.