Used SIGNATONE S-460 #293621435 for sale

SIGNATONE S-460 is a prober designed for wafer probing of semiconductor devices. S-460 is equipped with two probing needles allowing two electrical connections to the wafer, as well as independent temperature controllers which control the needle temperature and chamber environment temperature. This allows the user to select temperatures over a wide range, facilitating the measurement of different physical parameters. The prober has a X-Y-Z gantry structure, permitting the measuring heads to move over the wafer so that contact can be made with any desired point. By combining linear bearings, crossed-roller bearings, harmonic drives, and an internal separate AC servo motor, SIGNATONE S-460 is able to measure with minimal error over its measuring range of 15 mm × 15 mm. The prober is capable of reaching speeds of up to 60 millimeters per second, thus making measurements more efficient. S-460 is equipped with a high force sensing system making it suitable for heavy device probe cards. This system is composed of a load cell integrated into its needle probes as well as a force monitor. The load cell measures the magnitude of force generated by the needle movement while the force monitor tracks and displays the details of this force. This allows the user to monitor each contact point on the wafer with minimal error. SIGNATONE S-460 also offers a scanning function for the alignment of the wafer. Allowing the user to scan a programmed shape or alignment mark, the scanner makes the probing process more efficient and accurate by mapping the alignment marks. S-460 is integrated with software that offers advanced control capabilities, such as automatic compensation for any errors in the measurement and compensation for thermal effects on the probe. The software also provides a graphical user interface, so users may quickly and easily select the desired settings for the prober. In conclusion, SIGNATONE S-460 is a highly capable prober that offers a wide range of capabilities for semiconductor measurements, including two needle probes, a high force sensing system, and a scanning function. The advanced control software provides users with tools to quickly and accurately measure the physical parameters of a wafer.