Used TEL / TOKYO ELECTRON P-12XLn+ #9160189 for sale

ID: 9160189
Prober.
TEL / TOKYO ELECTRON P-12XLn+ Prober is a wafer prober designed for use in high precision, advanced semiconductor test solutions. The equipment was designed to facilitate flexible, small-scale, large-scale and repeatable testing capabilities for the rapidly evolving semiconductor market. This wafer prober offers a high throughput, high accuracy capability for high-volume production testing. TEL P12XLN+ is built on an advanced composite structural body, providing a robust frame that can accommodate up to twelve wafers in the providing compact cassette holder. Wafer loading, centering and alignment is achieved through advanced automated laser centered alignment technology. The system also features an automatic wafer mapping and identification unit via RFID tags, ensuring accurate test results. The advanced TOKYO ELECTRON P 12 XLN+ wafer prober is powered by a high performance central processing unit, which delivers an incredible speed up to 2GHz. Coupled together with the advanced motion control machine, the 64-axes motion tool allows up to 3um resolution high precision capability. The asset is also fully compatible with a variety of prober control software solutions, leading the way for fast, high-capacity testing. TOKYO ELECTRON P12XLN+ Wafer Prober also features a variety of safety and environmental features, including an insulated, flame retardant housing and protective glass doors, providing a safe testing environment. To further ensure the safety of humans and machines, TEL designed P 12 XLN+ with an automatic safety shut-off feature, which triggers if the model detects any abnormal motion or environmental conditions. Overall, TOKYO ELECTRON P-12XLn+ Wafer Prober is a powerful, precise and highly advanced semiconductor wafer prober, delivering unprecedented capabilities for testing and inspecting semiconductor chips. This equipment is ideal for high-volume production testing requirements in environments with minimal floor space, offering increased process speed and accuracy.
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