Used TEL / TOKYO ELECTRON P-12XLn #9161691 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XLn
ID: 9161691
Vintage: 2004
Prober Loader unit: 1 Lcd panel: With touch panel: Yes Signal pole: Red/Yellow/Green Front & rear cover: Red/Blue/Yellow / green: White Inspection tray : Yes Certificate: No Configuration settings System disk: HDD Mo disk: (Data storage): No Fd disk: (Data storage): Yes Probe_card holder Loader: Front one load_ port (indicator is brooks type) Needle alignment: Yes Needle height setting Wafer id reading (ocr): No Needle inspection: Yes Multi-pass probing: Yes Gp-ib I/f : Yes Ethernet I/f Automatic card change: Yes Pc unit: 200V/20A Hinge: Yes Chuck temperature: There is possibility of the low temperature trouble Chiller: Yes Printer Option: No Size (D x W x H) Weight(kg): 2506 CPU : VIP3 2004 vintage.
TEL / TOKYO ELECTRON P-12XLn is a high-performance prober designed for production and R&D testing applications. It is capable of performing high throughput and high accuracy probing on semiconductor, electronic, and optoelectronic devices. TEL P 12 XLN is an automated equipment that offers a high degree of flexibility to accommodate a variety of challenging product types. TOKYO ELECTRON P-12 XLN uses a combination of positioning, electrostatic actuation, and compound motion (X-Y-Z and theta motion axes) to move the probe tip to probe contact points on the substrate of interest. The prober also utilizes a "force control mode" to guarantee accurate and repeatable probing results. This force control mode allows users to adjust the probe stroke, speed, acceleration and deceleration to ensure consistent results. TEL P-12XLn has a resolution of 0.1µm and is fully programmable by GDSII, DXF and ASCII formats. This makes it ideal for applications where the accuracy and repeatability of probing results are critical. The prober also includes an automatic alignment function to make sure that the probe angle is aligned correctly relative to the substrate edge. TOKYO ELECTRON P 12 XLN includes a wide range of additional features to improve efficiency and performance. These features include an automated self-cleaning system to keep the probe and substrates clean, an auto-calibration unit to make sure that the probe is always at the correct height, and a probe recognition machine that automatically searches the wafer surface for probe contact points. In addition, P 12 XLN is designed with a high-speed memory storage tool for testing results, a 256-bit SSL encryption for secure data transmission, and a built-in diagnostics monitoring asset that can detect errors in order to prevent any potential problems from affecting the test results. Overall, TEL / TOKYO ELECTRON P 12 XLN is a powerful, reliable, and precise prober for a variety of production and R&D testing applications. With its high-speed and high-accuracy performance, it is capable of efficiently producing reliable probing results. The wide range of features and additional capabilities makes it an attractive choice for any demanding testing environment.
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