Used TEL / TOKYO ELECTRON P-12XLn+ #9220506 for sale

ID: 9220506
Vintage: 2005
Wafer prober Hot / Cold chuck temp: -25~150 Connecting tester T5375 / T5377 OS Version: Rzz00-R014.08QH Voltage: 200 VAC 2005 vintage.
TEL / TOKYO ELECTRON P-12XLn+ is a highly versatile prober designed for use in the semiconductor industry for probing of devices and circuits. TEL P12XLN+ is capable of probing on up to 12 full-width contact sites simultaneously, making it ideal for optimizing probing techniques and maximizing throughput. The prober is equipped with position and motion control systems that enable precision alignment and positioning of the probe site to ensure accurate probing. TOKYO ELECTRON P 12 XLN+ also features an ultra-high accuracy 4-axis motion system that enables the prober to position itself with extreme precision within the X, Y, R, and Z axes, providing a high level of control and flexibility in testing procedures. The prober also packs an advanced force-controlled scanning capability for repeatable and reliable probing results, as well as an adjustable needle pressure control mechanism for testing delicate components. TEL / TOKYO ELECTRON P12XLN+ offers a variety of probe holders, such as the low-profile TEL Hard Probe Holder and the JIS-compliant TOKYO ELECTRON Epoxy Mounted Probe Holder, both compatible with a variety of both manual and automatic probe card designs. The prober also features an integrated temperature monitoring system and an in-situ calibration system. The robust design ensures maximum uptime and ease-of-use, making it an ideal choice for reliability verification and advanced device testing. TEL / TOKYO ELECTRON P 12 XLN+ is a reliable and efficient prober with outstanding accuracy and consistent performance, making it the perfect choice for any semiconductor device testing and probing applications.
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