Used TEL / TOKYO ELECTRON P-12XLn #9236139 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XLn
ID: 9236139
Prober.
TEL / TOKYO ELECTRON P-12XLn Prober is a tool for performing automatic wafer probing in the semiconductor fabrication industry. It is used for testing the electrical characteristics of semiconductor devices, such as transistors and integrated circuits. TEL P 12 XLN Prober is designed to deliver consistent contact and information quality on a large-scale. It has a maximum contact force of 1 kgf and features a dual-lane wafer loading equipment, allowing a high throughput of wafers to be tested simultaneously. TOKYO ELECTRON P-12 XLN Prober boasts a broad probe card range and a user-friendly operator interface. The tool is designed to allow quick changes between probing cards and positional data, enabling a fast and easy test-and-programming process. With its high-speed operation, sensor signals and chips can be tested in-situ. The machine is equipped with a high-precision XYZ stage, which provides accurate and smooth movement for positioning the probe card. P 12 XLN Prober also features an optimized base to minimize disturbances from vibration and an airflow system to maintain a stable temperature environment for wafer testing. TEL / TOKYO ELECTRON P-12 XLN Prober can be either manual operation or partially-automated. It has two separate computer systems, one for motion control and one for unit monitoring. It also has a probe procedure file that can be automated to minimize manual operations. With its high-quality design, the automatic wafer probing process can be accelerated. P-12XLn Prober has a built-in touch panel that allows users to monitor the operation of the machine in real time. The touch panel display includes functions such as wafer loading, wafer testing, wafer unloading, and wafer mapping. It can also detect errors such as shorts and contact differences, as well as quantify data related to wafers that are tested. Overall, TOKYO ELECTRON P 12 XLN Prober is a tool designed to deliver optimal performance and reliability during automated wafer probing. It provides high-precision motion control and optimised airflow systems to ensure that wafers are adequately tested. With its robust design and automated features, TOKYO ELECTRON P-12XLn Prober is an effective tool for testing semiconductor devices.
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