Used TEL / TOKYO ELECTRON P-12XLn+ #9237368 for sale

TEL / TOKYO ELECTRON P-12XLn+ is a general-purpose prober highly versatile for any probing needs used in semiconductor wafer probing tasks. It has an X-Y stage with an 8-inch travel range and an integrated optical microscope for optical alignment. It features six independent wafer probing systems with up to twelve 200-pin of micro-manipulated probes for parallel wafer probing and alignment, as well as 3D alignment capabilities. The prober also has a precise pressure-regulation equipment that keeps the contact pressure between the probes and the wafer constant, so that there is no undesirable damage to the wafer. The P-12XLn+prober also features a real-time algorithm for high-speed wafer probing settling times, and an intuitive, user-friendly menu system. It has an LED illumination and an easy to adjust unit for controlling the brightness, allowing precise tracking over small alignment marks. In addition, the P-12XLn+prober is electrically stable with low EMI (electromagnetic interference) and RFI (radio-frequency interference) levels, enabling stable integrated circuit operation. It has an XY viso-metric measurement machine for both large and small IC (Integrated Circuit) features, which helps ensure high-accuracy measurement. Additionally, the prober is authenticated with both TUV Security and PCI SLOTS compliance. The P-12XLn+prober is capable of supporting a variety of methods for secure data exchange, such as SSH, RSA, and NTLM, allowing ECU/ECM (electronic control unit/electronic control module) communications to be sent safely between the server and the prober. It also supports TEL Tool Network function for transferring real-time monitoring and statistical data results for the prober from the server to the prober. Overall, TEL P12XLN+ is a sophisticated and reliable prober designed for detailed wafer probing tasks. It is capable of performing precise measurements with its powerful and flexible features, allowing semiconductor manufacturers to conduct reliable and accurate monitoring of their wafer-level devices.