Used TSE NTR-1000 #9241128 for sale

Manufacturer
TSE
Model
NTR-1000
ID: 9241128
Vintage: 2004
System 2004 vintage.
TSE NTR-1000 is a prober designed for high-precision wafer probing, production testing, and inline automated process control applications. Its features include automated probing and testing of semiconductor wafers, adjustable frames, high-speed communication interface, and an easy to use touch-screen control panel. The prober also provides integration with different metrology systems and production equipment. Using NTR-1000 prober, users can probe wafers with up to 90% test coverage and maintain a substrate temperature range of 5°C to 60°C. In addition, the prober improves overall system testing with its automated probing and testing operations, including wafers with fine beads and complex structures. Its adjustable frames ensure precise workpiece positioning and high throughput. The prober also features high-speed communication interface and an easy to use touch-screen control panel. Users can specify and control test parameter settings and execute tests using the panel. The prober also features an embedded quality assurance system which provides ongoing monitoring and report generation to ensure accurate test results. The prober can be integrated with different metrology systems and production equipment. This allows users to ensure accurate measurements and provide automated process control, reducing costs, production time and labor. Users can also connect to external test and inspection systems to further improve the prober's testing capabilities. TSE NTR-1000 prober is a high-precision wafer probing solution designed for both production and research & development applications. Its automated probing and testing operations, adjustable frames, high-speed communication interface, and easy to use control panel makes it an ideal choice for semiconductor test and control applications. The prober also offers excellent integration with other test and production equipment, allowing users to further improve their testing capabilities.
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