Used JOEL JWS-7515 #9155405 for sale

JOEL JWS-7515 is a scanning electron microscope (SEM) with a range of advanced features that offers excellent performance in both small and large sample imaging. The high performance, multi-mode SEM features a state-of-the-art design that allows for efficient operation and high-resolution imaging. The microscope provides a highly flexible field of view with up to 25.2 mm in a single field. It also utilizes an adjustable stage with a range of +/-6 mm in x and y-direction, allowing samples to be viewed in close detail. JWS-7515 is equipped with a high quality, large area FEG gun that uses an advanced electron optics system which offers a high-resolution imaging capability. This system is backed up by an ultra-stable power supply that can reach an electron beam voltage of up to 30kV. Additionally, a high contrast secondary electron detector yields very clear images, while the Faraday Cup can measure beam current densities from 1pA to 20mA. The SEM is designed to be user friendly and efficient, with several features for automated imaging. This includes auto-find functions for specimen alignment and auto-corrections for chamber gas pressure, dosages and voltage. Its motorized stage can maintain a set point of up to 5μm, allowing the user to concentrate on specimen analysis without worrying about alignment. JOEL JWS-7515 also offers an extensive range of possible imaging modes. These include secondary and backscattered electron imaging, as well as X-ray energy dispersive spectroscopy (EDS) and electron backscatter diffraction (EBSD). This instrument also offers variable pressure imaging and ion pumped possibility. All these features make JWS-7515 a reliable and versatile scan electron microscope, perfect for detailed imaging of a variety of specimen. Its high resolution, auto-find functions and automated stage allow for a quick and accurate examination of samples, making this SEM ideal for those needing a superior imaging experience.