Used KLA / TENCOR 8100XP #9258655 for sale

KLA / TENCOR 8100XP is a equipment which combines advanced optical and scanning electron microscopy capabilities as well as analysis software applications in order to allow for high resolution imaging and inspection of materials, devices, and other components. It is an advanced scanning electron microscope (SEM) which enables non-destructive and non-contact inspection of devices as small as 10 nanometers in size. It provides unparalleled magnifications of up to 200kX, along with imaging of large areas with ultra-high resolution. KLA 8100XP is comprised of a main unit, known as the Semiconductor Imaging Microscope (SIM). This unit includes an advanced electron gun emitters for imaging, as well as a 3-D detector to pick up signals from a variety of electron types. It also includes a special stage for manipulating and measuring devices, along with a digital image processing system. This unit is designed to allow for fast and accurate analysis of extremely small features, while still delivering high-resolution images. TENCOR 8100 XP uses a Transmission Electron Microscope (TEM) mode that is designed to inspect surfaces at nanometer resolution. This allows users to better detect characteristics such as crystal orientation, dopant concentrations, and other physical properties of the sample being examined. Additionally, 8100XP's 3D imaging machine allows for the evaluation of topographical features such as defects, grain size, and depth. Additionally, the SEM utilises automated image stitching technology which allows for the creation of larger images through combining several images into a single one. This makes it much easier to accurately evaluate the surface characteristics of larger samples, as imaging them as single images would take too long to be practical. TENCOR 8100XP also includes optional, add-on, software applications to provide automated metrology functions such as feature recognition, particle counting and size analysis, line width measurements, and other profile measurements. These applications are designed to save users time and effort as they can quickly analyze the surfaces of more complicated components. Overall, KLA / TENCOR 8100 XP is a powerful instrument designed for the analysis of nanomaterials and other small devices. It provides high-resolution imaging capabilities which allow for the inspection and analysis of even the smallest of features. Additionally, its optional software applications enable faster and automated analysis of surfaces.