Used LEO 906E #127270 for sale

LEO 906E
ID: 127270
CTEM microscope with Keenview camera.
LEO 906E scanning electron microscope (SEM) is a high-performance instrument used mainly for visual imaging, elemental and structural analysis, as well as surface morphology of a wide range of materials. It consists of a chamber, a specimen holder, an electron incident gun, and a detector. The specimen chamber is designed to prevent radio frequency radiation from entering the SEM as well as particles or ions from leaving the instrument. It features a specimen holder which allows positioning of materials both in the horizontal and vertical axes with sub-micron accuracy. The incident gun is composed of two electron sources, a hot-cathode thermal filament and a Schottky electron emitter. These two sources provide electrons of different energies that provide a better energy spread and greater resolution capabilities. The detector of 906E is optimized to measure electrons efficiently at different energies. It is comprised of a series of specialized detector systems including an energy-dispersive X-ray spectrometer (EDS) which controls the angle and speed of the electron beam to measure X-rays; a backscattering electron detector (BSD); a secondary electron detector (SED); and a charge coupled device (CCD). The imaging capabilities of LEO 906E can be operated at different magnifications and contrast levels which have an adjustable range of features provided by the imaging controls. This advanced instrument delivers high-resolution imaging of objects to a diameter as small as a nanometer. During imaging, the user can easily adjust the acceleration voltage and the beam current, which affect the contrast level of the sample and the resolution of the image. Furthermore, the EDX system of 906E allows the user to inspect all the materials in the sample and to obtain their elemental composition. This provides valuable information on the structure and nature of specimen. Other features of LEO 906E include stage movement tracking to allow for the systematic analysis of a specimen, as well as captured images and electron X-ray data can be stored on a disk or print it for further analysis. All in all, 906E scanning electron microscope is a powerful and user-friendly instrument used mainly for visual imaging, elemental and structural analysis, as well as surface morphology of a wide range of materials. It is an essential tool for research institutes and laboratories which seek to provide the highest quality of results with their studies and analysis.
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