Used LEO / ZEISS 1450VP #293597117 for sale

LEO / ZEISS 1450VP scanning electron microscope is an advanced, sophisticated piece of laboratory equipment designed for the purpose of magnifying and inspecting electron images in the nanoscale range. As a scanning electron microscope (SEM), it enables users to generate very high-resolution images of specimens, allowing for the observation of structural features on the nanometer scale. LEO 1450VP is a "field emission" SEM, meaning that it utilizes a filament-type electron source instead of adsorbed materials, which allows for improved detector response, higher resolution, and a more stable imaging system. The SEM includes a set of objectives and lenses through which electrons pass while scanning the specimen, creating an image that is magnified and improved in resolution. This can allow researchers to observe tiny details on the specimen, such as atomic positions and chemical bonds. The electron source is capable of creating imaging resolutions to 0.75nm, and the microscope also includes a "secondary" column which allows for even higher resolutions of 0.2nm. This can provide a clear picture of even the smallest features, such as individual atoms and molecules. The SEM also has the ability to acquire backscattered and secondary electrons, giving researchers further access to features that the primary electrons may not be able to see. In addition to resolution, ZEISS 1450VP also provides three operating modes of low- and high-voltage scanning and tungsten-filament microscopy. These modes can capture both high-quality images and large maps of a specimen and its chemical composition, as well as simulate electron transport properties for the purpose of testing or evaluating a given system. The SEM also features a proprietary "Brief Scan" mode, which can quickly obtain wide-area results without the need for tedious, prolonged maneuvering. To ensure the highest possible accuracy, 1450VP also includes a number of advanced software programs that can control all functions of the microscope. The software includes an intuitive quick scanning interface, allowing users to quickly create and reset a region of interest and start imaging within seconds. In addition, integrated alignment functions allow users to accurately measure physical dimensions and quickly and easily assess the accuracy of their results. Overall, LEO / ZEISS 1450VP scanning electron microscope is an incredibly powerful and valuable tool for any research laboratory. Its use can allow for nanoscale observation and imaging, giving researchers an unprecedented look into tiny details of molecular and atomic features. As such, it can drastically improve and speed up the scientific process, providing results of a clarity and resolution previously impossible.