Used PHILIPS / FEI CM12 #9302349 for sale

PHILIPS / FEI CM12
ID: 9302349
Scanning Electron Microscope (SEM).
PHILIPS / FEI CM12 is a scanning electron microscope used for examining the microscopic composition of various samples. It is equipped with a large field emission gun, a detector system, and a reaction chamber capable of producing high resolution images of samples up to a size of 12 mm. It has a wide range of applications including material science research, nanotechnology, semiconductor manufacturing, and surface analysis. FEI CM12 is capable of producing high-quality images with a resolution up to 10 nm, allowing users to detect and analyze tiny structural and compositional details of a sample. It is equipped with an array of sensitive detectors, including a SEM-EDS system that enables elemental analysis. Additionally, it offers integrated lift lever and sample tilt functions, as well as a wide range of Magnification Materials Analysis (MA) programs for investigating surface structures, such as microcrystalline structures. PHILIPS CM 12 is designed to be user-friendly and offers intuitive user interfaces, making it easy to navigate menus and control multiple settings. The powerful vacuum technology in the microscope is capable of operating in ultrahigh vacuum (UHV) conditions, allowing for sample introduction without any contamination. In addition, its efficient automation features make it possible to quickly collect imaging and spectroscopic data from a variety of samples. PHILIPS CM12 is an advanced microscope featuring the latest technologies and a wide range of applications that enable researchers to analyze materials with precision and accuracy. Its intuitive user interface and powerful system make it an excellent choice for materials research and inspection.
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