Used RAITH 50 #293636314 for sale

RAITH 50 Scanning Electron Microscope (SEM) is a versatile, high-performance imaging platform for nanotechnology and materials science. Its cutting-edge engineering and design allow for high magnifications, excellent image resolution, and detailed sample characterization. The core operating parameters of 50 include a 3 nm lateral and vertical resolution, 30 nm depth of field, and a maximum magnification of 500,000 times. It has a excellent imaging dynamic range and a wide field of view. It also features an advanced electron column that reduces interference and improves overall performance. RAITH 50 operates on the principle of Secondary Electron Imaging, or SEI. In SEI, a sample is bombarded with a beam of high-energy electrons, stimulating electrons to escape from the sample. These secondary electrons are then detected by a detector and used to create an image. 50's high-performance column and detector facilitate detailed raw sample measurements and improved detection sensitivities. RAITH 50 is equipped with a high-performance X-ray microanalysis equipment. This system allows for detailed characterizations, elemental mapping, and quantification of samples. It uses an X-ray source to excite electrons within the sample, resulting in characteristic X-ray photopic peaks. These peaks provide an elemental signature of the sample, allowing for detailed characterization. 50 is also equipped with an automated stage unit, which allows for scans over a wide area. The stage enables the operator to obtain images anywhere on the sample surface, giving a detailed overview of the sample. RAITH 50 is a sophisticated imaging machine, capable of providing detailed characterizations and measurements. With its high-performance electron column, X-ray microanalysis tool, and automated stage, 50 offers a wide range of capabilities for nanotechnology and materials science.