Used SII NANOTECHNOLOGY / SEIKO SMI 2050 #293646429 for sale

ID: 293646429
Vintage: 2004
Focused Ion Beam (FIB) system 2004 vintage.
SII NANOTECHNOLOGY / SEIKO SMI 2050 is a leading scanning electron microscope (SEM) in the market. It is designed to offer excellent imaging and analytical capabilities with the added benefit of superior beam stability and reliability. SEIKO SMI 2050 is capable of providing 3D topographical imaging of a sample's surface down to the atomic level. It can be used in a wide range of applications, including research and quality assurance tasks. SII NANOTECHNOLOGY SMI-2050 is a versatile and powerful system equipped with an advanced imaging and analysis software. It features an automated SPM (scanning probe microscope) for analyzing surface topography, a CPD (contact potential difference) for determination of sample composition, an EDS (energy dispersive spectroscopy) for elemental analysis and a SCH (scanning capacitance microscope) for nanoelectrical measurements. Furthermore, SII NANOTECHNOLOGY / SEIKO SMI-2050 is equipped with a high-resolution digital camera and a high-quality sample stage to ensure a good repeatability and measurement consistency on the specimen. SMI 2050 is capable of high-precision imaging and analysis. Through the use of advanced imaging functions such as 3D-SIMS (simultaneous small angle and large angle illumination), Zernike phase contrast and bright field imaging, SII NANOTECHNOLOGY SMI 2050 is able to obtain images with a highly level of detail and clarity. Moreover, because of its robustness and high functionality, the instrument has been used for various applications, from basic research to quality assurance tasks. The high-quality performance and features of SEIKO SMI-2050 make it ideally suited for a variety of applications, such as material science, nano-electronics, bio-technology, and forensic sciences. Thanks to its advanced detector and high-performance electronic system, SMI-2050 is able to capture high-resolution, high-contrast 3D images and generate 2D/3D images of microstructures, particles and surfaces. Its depth resolution also makes it ideal for inspecting intricate micro-electrical and/or metallurgical elements, such as semiconductor chips. SII NANOTECHNOLOGY / SEIKO SMI 2050 also benefits from its advanced software capabilities. Its SEM Imaging Suite includes Advanced Image Analysis software to measure, quantify and analyze surface images easily, fast and accurately. Its easy to use NanoSIMS software is used to correlate multiple atomic parameters, such as chemical concentration, grain size, and crystallographic orientations in a sample. SEIKO SMI 2050 is also designed with safety features such as user-friendly operation and instrument safety features. Its security features include user access control and single-sign-on authentication systems for each user. Overall, SII NANOTECHNOLOGY SMI-2050 is a powerful and versatile instrument with a range of features that make it ideal for a wide range of applications. This advanced technology enables researchers and quality assurance professionals to obtain information about samples at the micro and nano scale, benefitting from its enhanced levels of precision, reliability and accuracy.
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