Used SII NANOTECHNOLOGY / SEIKO SMI-3050 #9078488 for sale

SII NANOTECHNOLOGY / SEIKO SMI-3050 scanning electron microscope (SEM) is a state-of-the-art instrument designed specifically for use in nanotechnology. It is a high performance, relatively high resolution SEM with a wide range of features allowing for advanced imaging and analysis of nano-scale materials. SEIKO SMI-3050 is equipped with two different electron detectors: a secondary electron (SE) detector and a backscattered electron (BSE) detector. The SE detector provides detailed information on a specimen surface, while the BSE detector offers a more three-dimensional analysis. Additionally, SII NANOTECHNOLOGY SMI-3050 is equipped with an Everhart-Thornley detector that provides a high precision mapping of surface currents. SMI-3050 is capable of imaging objects down to a resolution of just 1 nanometer. It uses a newly-designed cold-field emission gun that provides exceptional stability and low noise for spectacular imaging results. Additionally, the instrument provides extremely low sample drift and vibration for greater accuracy. SII NANOTECHNOLOGY / SEIKO SMI-3050 offers a unique combination of advanced imaging techniques for characterizing surface topography and nanostructures, including drawing maps of crystal orientations, analyzing surface potentials and phases, and studying the dynamics of charge distribution. SEIKO SMI-3050 also offers a range of advanced analytical techniques, such as energy dispersive X-ray spectroscopy (EDX) capability, spectrometry and bead analysis. EDX can be used to provide elemental mapping of the local composition of specimens, a useful technique for studying contaminants on samples. Spectrometry enables the analysis of features such as grain size and composition in specimens, while the bead analysis feature allows the user to quantify particle resonance frequency. SII NANOTECHNOLOGY SMI-3050 has a strong presence in a number of fields, such as materials science, semiconductor engineering and nanotechnology. It is a well-suited tool for researchers who are interested in studying both scientific and engineering materials, such as metals, alloys, ceramics and plastics. Its ability to provide extremely fine resolution imaging and a range of analytical techniques makes it an invaluable instrument for a variety of research applications.