Used TESCAN Vega II #293628959 for sale

TESCAN Vega II
ID: 293628959
Scanning Electron Microscope (SEM) Variable pressure XLU SED BSED.
TESCAN Vega II is a Schweizertronic-based scanning electron microscope (SEM). It is a high-performance, feature-rich instrument that provides rapid elemental mapping with top resolution and contrast. TESCAN VEGA-II is engineered to provide ultimate versatility and performance, while also incorporating analytical capabilities. Vega II is equipped with a unique dual-mode electron source that offers both spot shooting and low-dose imaging. In the spot shooting mode, a large spot shape detector allows for fast, efficient elemental mapping over the full area of a sample with minimal beam drift and aberration. In low-dose imaging mode, VEGA-II is capable of acquiring planar images with extremely low beam current and noise levels. The lens column of TESCAN Vega II is loaded with beam extinction chromatic aberration correction and other advanced positioning technology, allowing for fast and precise positioning of the electron beam and the sample. TESCAN VEGA-II features an ultra-stable joystick-controlled UltraFlex stage, which allows for the widest range of sample motions in all directions. Vega II is equipped with an intelligent new gas inlet system, which is designed to allow for an intuitive and easy control over the chamber pressure during specimen preparation and analysis. The gas inlet system also allows for fast switching between high-pressure and low-pressure operation, enabling the maximum versatility in sample analysis. VEGA-II can be equipped with an advanced imaging detector that allows for the user to collect ultra-bright imaging and spectroscopic data with a single detector. This detector allows for multi-signal conditions to be captured simultaneously, allowing for highly efficient imaging and elemental analysis. TESCAN Vega II also uses unique Cs-corrected technology, which enables improved imaging resolution, contrast, and depth of field. This technology allows for precise placement of the electron beam and sample to ensure the best possible conditions for imaging and analysis. In addition to its advanced imaging and analytical capabilities, TESCAN VEGA-II features a comprehensive suite of software tools, including the intuitive TESCAN IoAnalyzer, which is designed for controlling, managing, and operating the microscope. TESCAN IoAnalyzer is easy to use and allows for fast and easy image acquisition, image editing, post-processing, and analysis. To summarize, Vega II is a state-of-the-art scanning electron microscope that offers maximum versatility, performance, and analytical capabilities. Its advanced dual-mode electron source, ultra-stable joystick-controlled UltraFlex stage, intuitive gas inlet system, and sophisticated imaging and analytical tools enable users to achieve high-resolution imaging and elemental mapping quickly and precisely.
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