Used TOPCON SM 300 #9220578 for sale

TOPCON SM 300 is an advanced scanning electron microscope (SEM) designed to provide superior imaging with exceptional precision. It utilizes electron optics and scanning stage technologies to produce high-resolution images of small objects with remarkable clarity. SM 300 offers a wide range of magnifications for imaging, starting at 5x and extending up to a maximum of 300,000x. It is capable of producing images with very accurate depth of field, detailing features with nanometer resolution. This feature makes it capable of imaging at the atomic level, enabling detailed examination and analysis of a wide range of materials. The electron gun used by TOPCON SM 300 is energy-filtered, enabling researchers to manipulate the energy of the electron beam to produce higher quality images. This feature can be used to acquire greater levels of detail, enabling the examination of small scale features such as surface microstructures and grain boundaries. SM 300 utilizes a highly sensitive detector that is capable of detecting particles as small as 10 to 100 picometers. This allows researchers to distinguish features with very high precision, and acquire quantitative information about their sample. The unit also features an automated image processing mechanism, allowing researchers to quickly and accurately assess data obtained from the scanner. The unit also comes equipped with a high-resolution stage that enables the circular scanning of samples, enabling the acquisition of large images in a short amount of time. TOPCON SM 300 is also capable of mapping very small features across a large sample area, expanding its usage to multidimensional studies. It comes equipped with a powerful automated data analysis system, allowing the researchers to quickly perform their analysis and assessment of the sample. The details obtained from SM 300 can be used to evaluate the morphology, composition and structure of samples with great accuracy. In addition, it can be used in the study of nanoscale materials, and the research of new material properties in various fields.