Used PHYSICAL ELECTRONICS / PHI 670 #9205333 for sale

ID: 9205333
Field emission auger electron spectroscopy Computer with tool Turbo pump with tool BERTAN Power supply Does not include: Pump station Roughing pump.
PHYSICAL ELECTRONICS / PHI 670 is a highly sophisticated spectrometer designed for the analysis of complex materials and surfaces. PHI 670 offers an array of features allowing for precise data collection and analysis. The instrument incorporates a laser-based optical spectrometer for advanced measurements, including angle-resolved photoemission spectroscopy (ARPES), ultra-violet photoemission spectroscopy (UPS) and X-ray photoelectron spectroscopy (XPS). The spectrometer further offers the integrated analyzer, which provides a wide range of information about the sample, including binding energy and spectral resolution. PHYSICAL ELECTRONICS 670 contains an optical table, flexible sample holder and highly sensitive detector, allowing for precise and accurate data collection. The table is configured with a gliding-reflection monochromator and a velocity selection aperture that accept varying laser energy inputs from UV to X-ray frequencies. The flexible sample holder allows optimized surface interrogation and angle-resolved measurements with minimal sample positioning or rotation errors. Also, the equilibrium substrate temperature in the sample holder can be adjusted to match the laser energy source. The spectrometer offers two different modes of data collection. Single-shot data collection is characterized by rapid data acquisition with minimal setup, while real-time data collection allows for the analysis of dynamic processes. Additionally, 670 has a multi-channel scanning capability for depth profiling the refractive index for subsurface layers and thin film. This is useful for monitoring the optical and interference properties of substrate layers. Furthermore, PHYSICAL ELECTRONICS / PHI 670 can measure multiple kinetic and thermal processes simultaneously such as desorption, scattering, chemical reactions, and thermal release. PHI 670 is designed to measure precise data, while offering a rapid data collection and acquisition process. Its combination of features makes it an excellent choice for a variety of Applications in PHI. Beyond measuring complex processes, it is also effective in characterizing materials, thin films, substrates, and sensors for surface science and materials analysis. PHYSICAL ELECTRONICS 670 is ideally suited for industrial and research laboratories that require a state of the art spectrometer for precise, accurate data measurement.
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