Used ULVAC TOF-SIMS TFS-210 #9078417 for sale

ULVAC TOF-SIMS TFS-210 is a TriboField® Secondary Ion Mass Spectrometer (SIMS) designed for advanced research and development applications. This Time of Flight (TOF-SIMS) based instrument has high resolution and superior mass accuracy, making it ideal for surface characterization of semiconductor and organic materials. TOF-SIMS TFS-210 system is capable of analyzing wide mass ranges from a few amu up to more than 1500amu, with sensitivity at the low mass range of up to approximately 50amu. With its high-precision optical design, it provides excellent mass resolution with isotopic peak separation from monoisotopic masses. ULVAC TOF-SIMS TFS-210 has a tribofocused source, allowing for efficient mass spectrometry of even small molecule ions. In addition, the system is also equipped with an electrospray ion source for the analysis of samples with organic compounds and for positive ionization of small molecules. TOF-SIMS TFS-210 also has a two-step drift tube system for the selection of the primary ions so that secondary ions of interest can be separated from ones that are unwanted. The TOF-SIMS has five different methods available for data acquisition, making it versatile in applications. These programs include the transmission method, a three-step desorption method, a variable energy mass selection method, a recoil ion method for detecting trace species, and an erosive imaging method that can perform ion imaging and sputter depth profiling. ULVAC TOF-SIMS TFS-210 also has several software options available for easy sample preparation and data processing. Tutorials and training are available for those who require more in-depth access to the data and analysis capabilities. Overall, TOF-SIMS TFS-210 is an ideal tool for in-depth surface characterization, with its combination of high-resolution and superior mass accuracy. With its flexibility in sample preparation techniques and easy-to-use software, ULVAC TOF-SIMS TFS-210 is perfect for researchers in a wide variety of fields.