Used AMAT Sting II #293621200 for sale

ID: 293621200
Vintage: 2011
Darkfield defect inspection system (2) Load ports Chamber.
AMAT Sting II is a wafer testing and metrology equipment designed to provide users with real-time results on the quality of semiconductor wafers. It is highly accurate in detecting surface defects, measuring the roughness of the surface, performing thickness measurements, and analyzing the internal structure of the wafer material. The system is equipped with a motorized rotary table, which allows for precise positioning and measurement of the wafer. An advanced optical imaging technology is used in Sting II to provide users with accurate readings on the surface, structure, and other characteristics of the wafer. The rotary table of AMAT Sting II can tilt and rotate in both X and Y directions to achieve exact measurements, and a highly-precise motion controller is integrated into the device to ensure this accuracy. The unit is powered by a scanning laser source and a CMOS sensor, allowing for imaging at any angle, and for higher precision measurements. Sting II utilizes an extended field of view for scans that provide users with a wider-ranging view of the wafer surface. AMAT Sting II is a fully automated machine that is equipped with an ergonomic and intuitive touchscreen interface that makes it easy to use. The tool is also capable of performing high-resolution imaging, which can be used to analyze the microstructural features of the wafer. The software of the asset is available in multiple languages, and includes a variety of powerful functions that enable users to quickly analyze large amounts of data. Sting II is a robust model that can run unattended for extended periods of time, and its performance is stable throughout the entirety of its permitted range. Furthermore, the equipment is designed to be upgradeable over time, allowing for expanded capabilities for various applications as needed. AMAT Sting II is certified to meet the most stringent safety requirements, and is compliant with numerous international standards. In conclusion, Sting II is a advanced wafer testing and metrology system that is designed to provide users with reliable, accurate results. AMAT Sting II offers a wide range of features that make it suitable for use in various semiconductor applications, and its intuitive interface and upgradable design make it an ideal choice for any user that needs a reliable, accurate tester.
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