Used FEI DA300 #9259263 for sale

FEI DA300 is a wafer testing and metrology equipment designed to provide the highest precision, accuracy, and speed for nanometer-scale device testing and characterization. The system is configured with two measurement heads, making it possible to measure two different samples simultaneously with no physical movement. This makes it ideal for data-intensive experiments such as defectivity studies. DA300 operates on a high-power laser-illumination unit that allows low-dose measurements even at very high resolutions. The machine also features a high-speed, dual-lens optical tool, which helps achieve high-resolution measurements. The asset also features a wide dynamic range, enabling the user to measure devices even in tough conditions. FEI DA300 is also equipped with precision metrology technology, allowing the user to measure structures down to nanometer levels. This makes it ideal for precision device testing and monitoring. The model also uses advanced imaging techniques, allowing the user to acquire images with pixel-perfect detail and clarity. The user can also analyze the acquired images very quickly and accurately. DA300 is also equipped with a range of software packages for data acquisition, analysis, and visualization. These features make the equipment ideal for device testing and characterization. FEI DA300 features an intuitive and user-friendly graphic user interface, and a range of hardware and software options for customization. This feature helps the user to easily evaluate the results of their experiments quickly and efficiently. The system can also be upgraded with various options as desired by the user. Overall, DA300 is a highly advanced wafer testing and metrology unit. It is designed to provide high-precision and high-speed measurements, allowing the user to obtain nanometer-scale results. The user-friendly and feature-rich machine also provides a wide range of customization options, making it ideal for any type of experiment or analysis.