Used FSM / FRONTIER SEMICONDUCTOR 8800 #9400273 for sale

FSM / FRONTIER SEMICONDUCTOR 8800 is a high performance, full-featured and cost effective wafer testing and metrology equipment offering high speed, ultra-low noise measurements and high resolution measurement accuracy. This system offers a wide range of wafer testing and metrology functions, as well as an integrated mapping and measurement unit that facilitates the automated testing of larger wafer diameters. The wafer testing and metrology machine consists of three main components, which include a CCD optical microscope, a highly accurate, specialty measurement frame and an integrated microcontroller-based electronics package. The CCD optical microscope features a large aperture, high-resolution and low-noise detector array capable of measuring the performance of both planar and vertical structures across a wide range of wafer sizes. The integrated measurement frame allows for accurate and repeatable alignment of the CCD optics, allowing for critical examination and characterization of test structures during the testing process. The microcontroller-based electronics package offers sophisticated control capabilities, allowing for precision control even for the most detailed and highly accurate measurements. The package integrates an Analog-to-Digital Converter (ADC) with a digital output, enabling automation. Furthermore, it provides an adjustable power supply with an internal voltage regulation channel, allowing for excellent repeatability of measurements. Finally, FSM 8800 also offers a range of advanced software features, including on-the-fly parameter settings, automated mapping, accelerated defect targeting and various other features that help maximize the efficiency of the testing process. In summary, FRONTIER SEMICONDUCTOR 8800 is a high-performance and cost-effective wafer testing tool that offers the capability to perform reliable and accurate measurements. It is equipped with a cutting-edge optical microscope, superior measurement frame and a suite of automated and on-the-fly parameter settings. This asset is perfect for high-density wafer or component testing and characterization.