Used KLA / TENCOR / PROMETRIX Omnimap RS-50 #293614908 for sale

KLA / TENCOR / PROMETRIX Omnimap RS-50 is a multi-functional, automated equipment used for testing and metrology of semiconductor wafers. It combines both high-precision optical and tactile technologies to deliver accurate and reliable wafer measurement results. The RS-50 features a variety of advanced technologies to meet multiple metrology and test requirements. The RS-50 combines an advanced low-light imaging system with a high-throughput stage to provide extremely high resolution measurements of both line and other physical attributes. The RS-50 allows for a high level of accuracy for both image-based and non-image based measurements. This makes it ideal for many applications requiring high-precision metrology for specific feature sizes and widths of fines, lines and other non-image based measurements. The unit is designed for high throughput and feedback-driven automation. It can measure a range of wafer sizes from 5" to 12" with a precision of 1 micron. It features an intelligent wafer handler, bright illumination (including near-infrared illumination), and aberration-corrected lenses. Among other features, KLA Omnimap RS-50 includes a user-friendly, automated optics control and measurement software to facilitate precise control of multiple objects in the field of view. The RS-50 is also equipped with a fully automated wafer handler, which features optical feedback technology to ensure precision placement of the sample. This ensures accurate alignment of the sample and maximizes repeatability and data accuracy within a single measurement cycle. The machine has superior measurement capabilities for the most challenging devices, even in the presence of wrap-around or die-edge constraints. The RS-50 is designed for maximum flexibility to accommodate different metrology requirements. The process integration of its software enables fast and easily customizable automated recipe-driven metrology, resulting in improved throughput and data quality. Its advanced metrology capabilities also offer fast and reliable measurement results, allowing engineers to save valuable time and resources on their projects. TENCOR Omnimap RS-50 is a powerful, versatile tool for testing and metrology of semiconductor wafers. This asset offers users precise control, accurate measurements, and automated high-throughput capabilities. Its repeatable, reliable results and user-friendly nature make it a perfect solution for high-precision semiconductor wafer testing and metrology.