Used KLA / TENCOR / PROMETRIX Omnimap RS-55TC #293605706 for sale

ID: 293605706
Wafer Size: 2"-8"
Four point probe resistivity mapping system, 2"-8" Sheet resistance Trend charts 3-D Mapping and contour Polar contour Diameter scans or X-Y maps.
KLA / TENCOR / PROMETRIX Omnimap RS-55TC is a wafer testing and metrology equipment that provides high accuracy and resolution for a wide range of applications. It is designed for precise measurements of thin films, circuits and other wafer structures. The system features a large field of view and high-speed, precise measurement capabilities. The RS-55TC consists of an optical subsystem and a motion subsystem. The optical subsystem features a high-resolution, monochrome digital camera with a wide field of view, allowing for accurate measurement and assessment of the physical features of a given wafer. It also uses a patented Quad cell technology for improved signal-to-noise ratio. The motion subsystem enables fast, repeatable, and controlled scanning of wafers with high precision and accuracy. The RS-55TC unit is accurate and reliable, providing highly precise and repeatable measurements. It is capable of delivering results within a high degree of accuracy on a single die or across multiple dies. It also offers impressive flexibility with its integration of various sensors and probes, allowing for various applications such as high-resolution imaging, X-ray spectroscopy, and resistivity/conductivity analysis. The machine also includes advanced wafer testing and monitoring capabilities, with built-in alarm settings to alert users to any drifting parameters or other anomalies. It also includes integrated process control software and advanced data analysis tools for quick and easy data assessment. Furthermore, the tool provides USB connectivity for easy transfer of data, allowing users to quickly analyze results and make decisions and adjustments. Overall, KLA OMNIMAP RS-55/TC is an advanced wafer testing and metrology asset for precise measurements. It is designed for repeatable and accurate wafer measurements, with advanced process control, monitoring and data analysis features. With its USB connectivity and vast array of features and capabilities, it is well suited for a wide range of applications.
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