Used KLA / TENCOR / THERMA-WAVE Optiprobe 2600 #293597102 for sale

KLA / TENCOR / THERMA-WAVE Optiprobe 2600 is a high-performance tool for testing and metrology on semiconductor wafers. Its user-friendly software automates the collection of data for testing, metrology, and analysis, allowing users to quickly and accurately gather information about their wafers. This system is designed to meet the needs of high-technology and high-density semiconductor wafer applications where precise analysis is required. KLA Optiprobe 2600 is designed to facilitate the accurate wafer testing and metrology required in the development and production of leading-edge semiconductor integrated circuits. The system uses technologies such as top-down and/or dual-view CCD imaging, advanced illumination techniques, advanced algorithms, and patented probe technologies to deliver rapidly and accurately. The set of tools and technologies makes TENCOR Optiprobe 2600 ideal for testing the most challenging integrated circuits and wafers. THERMA-WAVE Optiprobe 2600 provides a complete set of pre-configured surface measurements, electrical testing & metrology measurements, and complex defect parameter analysis. These pre-configured measurements enable users to quickly run surface metrology on their wafers to collect data for analysis. The system also includes advanced image analysis algorithms that detect and classify defects quickly and accurately. Optiprobe 2600 is integrated with software and hardware tools for data analysis and statistical process control. The software suite provides quick setup and calibration, automated data collection, data processing and analysis, display of results, and statistical process control. The hardware tools provide a flexible and powerful platform for characterizing the wafer's performance and reliability. KLA / TENCOR / THERMA-WAVE Optiprobe 2600 is one of the most advanced systems available for testing and metrology on semiconductor wafers. It offers an intuitive, user-friendly interface and powerful hardware tools that allow users to quickly and accurately collect data, analyze results, and control the processes associated with semiconductor fabrication.