Used KLA / TENCOR / THERMA-WAVE Optiprobe 2600 #293671329 for sale

ID: 293671329
Film thickness measurement system.
KLA / TENCOR / THERMA-WAVE Optiprobe 2600 Wafer Testing and Metrology Equipment is a reliable, advanced wafer testing and metrology system designed for the monitoring and process control of the semiconductor fabrication process. KLA Optiprobe 2600 is equipped with an advanced optical imaging unit that enables it to analyze wafers with high resolution and accuracy. The advanced optical imaging machine features multiple methodologies, such as point inspection, surface imaging, laser mapping, and particle measurement, to characterize feature sizes, layer thicknesses, and surface roughness. The wafer map generated by TENCOR Optiprobe 2600 includes a summary view of different characteristics of the wafer, along with different displays for the individual measurements of each unit. The display of measurement results allows users to quickly identify areas of performance variations among different parts of the wafer. To further ensure the quality and uniformity of the wafer, THERMA-WAVE Optiprobe 2600 includes a powerful data analysis software package. This data analysis software provides a comprehensive suite of tools to analyze wafer maps for the detection of anomalies, contamination, and process shifts. The software package also supports a wide range of file formats, giving users the ability to easily incorporate external process control parameters and analysis. Optiprobe 2600 is also compatible with a range of Scanning Electron Microscopes (SEMs) for advanced process monitoring and control. The combination of KLA / TENCOR / THERMA-WAVE Optiprobe 2600 with SEMs knows as SPM (scanning probe microscopy) provides the highest-resolution measurement of surface texture in the semiconductor fabrication process. In addition to providing a comprehensive suite of test analysis tools, KLA Optiprobe 2600 is also an easy tool to use. The graphical user interface is intuitive and allows for quick access to the different measurement displays. This makes it easy for users to quickly diagnose production anomalies and take corrective actions. TENCOR Optiprobe 2600 is a reliable, advanced wafer testing and metrology asset that makes it easier for semiconductor manufacturers to monitor production processes and ensure the highest quality product. With its optical imaging model, data analysis capabilities, and compatibility with SEMs, THERMA-WAVE Optiprobe 2600 offers an efficient way to monitor the wafer manufacturing process.
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