Used KYOWA K-750RM #9230478 for sale

ID: 9230478
Wafer Size: 4"
Resistivity measurement system, 4".
KYOWA K-750RM is a highly advanced wafer testing and metrology equipment designed to meet the needs of next-generation wafer production processes. Featuring a resolution of up to 1nm on each of the three axes, this wafer metrology system is capable of accurately measuring static, dynamic, and structural features, allowing for comprehensive analysis with unparalleled accuracy. The unit runs on a high performance controller, featuring a six-axis robot arm, a three-axis laser scanning module, and an optical microscope for measuring both flat and curved objects. K-750RM uses advanced software algorithms to process raw data from the machine quickly and efficiently resulting in quality, accurate results. The wafer tester is capable of performing a variety of metrology tasks across a wide range of materials, including hard and soft materials, such as ceramic, glass, and polymers. To ensure precise, repeatable results, the tool utilizes a combination of 3D optical interferometry and scanning white-light interferometry to provide high performance data for the most demanding applications. KYOWA K-750RM also comes with a suite of tools for studying surface form in 3 dimensions, including a process for simulating the effect of processes on the surface of a wafer, as well as for investigating the effects of factors, such as vibration, temperature, and environmental pollutants. The asset can also accommodate multiple tool heads for measuring multiple features in the same operation. Other standard features of K-750RM include: aPCI Express interface for data transfer, a vibration isolation plate to minimize noise interference, and an advanced scanning model for locating feature points with a maximum speed of 8 m/s. The equipment also features a unique data-logging feature that allows users to track wafer testing and metrology data from start to finish in order to optimize the measuring and testing process. Overall, KYOWA K-750RM is an essential tool for the most demanding and precise wafer testing and metrology applications. The system provides the highest accuracy and reliability as well as the flexibility to handle a wide range of materials. The unit offers unparalleled accuracy and productivity, ensuring quality results and reducing the risk of costly errors.
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