Used METRYX Mentor #293625778 for sale

METRYX Mentor is a wafer testing and metrology equipment designed for fabless semiconductor companies, commonly used for failure analysis, process engineering, device engineering, and process control. The system includes two basic components: Mentor hardware and METRYX Mentor software. Mentor hardware consists of several key components, including a wafer testing machine, probe card, vision unit, and wet station. The wafer testing machine is the main component of the machine, allowing users to quickly and accurately analyze a wafer's electrical characteristics. The probe card is responsible for making electrical connections between the wafer and the test fixtures. The vision tool is used to accurately measure physical characteristics of a wafer, while the wet station allows engineers to chemically and physically inspect the wafer's surface. METRYX Mentor software suite is the main interface between the user and the hardware. It allows engineers to quickly and accurately analyze a wafer's electrical characteristics, as well as other physical parameters. The software also offers a graphical user interface, allowing easy navigation and configuration of the asset. It enables users to easily monitor and control the model, as well as giving quick access to test results. In addition to its basic operating features, Mentor offers differential analysis, process control, and statistical analysis capabilities. With differential analysis, engineers can run advanced tests to compare the characteristics of two different wafers. This can be used to diagnose potential problems or correlate performance results to process parameters. Furthermore, the equipment supports process control, allowing engineers to adjust parameters on the fly to alter wafer characteristics. Finally, statistical analysis is used to compare current wafer results with previous wafers, ensuring state-of-the-art process control. Overall, METRYX Mentor is a powerful system for testing, analyzing, and controlling the fabrication of semiconductor devices. Its hardware components, software features, and other advanced capabilities allow users to quickly and accurately analyze and control complex devices. With its integrated features, users can easily monitor and adjust devices to get the desired performance results.