Used NIKON 6D #9271445 for sale

NIKON 6D is a high-performance wafer testing and metrology equipment designed to increase throughput and accuracy of wafer inspections. The system is equipped with a specialized 5-axis wafer testing head that allows for high-precision testing and measurement of wafers up to 300mm in diameter. 6D utilizes a unique closed-loop control unit to ensure accuracy of the testing process, while a variety of imaging systems are interfaced to acquire 2-D and 3-D displacement information for metrology. NIKON 6D machine features a variety of advanced technologies capable of measuring parameters commonly associated with wafer testing and metrology. These include Elongation, Area Scoring, Oxide Thickness measurements, Contamination Analysis testing and Critical Dimension measurements. The tool is also capable of performing accurate profile measurements and micro-defect inspections. 6D asset is a multi-sensor platform that supports both traditional wafer testing and new metrology techniques. Its 5-axis wafer testing head allows for fast and accurate testing and measurement of wafers up to 300mm in diameter. The use of an advanced Closed-Loop control model ensures highly repeatable testing and measurements. Additionally, the use of stainless steel construction in the wafer testing head contributes to the robustness and longevity of the equipment. NIKON 6D system also offers a range of imaging systems for acquisition of 2-D and 3-D displacement information for metrology. This allows for accurate profile measurements and micro-defect inspections. Additionally, a variety of software packages are available for full data analysis and reporting. These allow for detailed evaluation and quality control of wafers in accordance with the highest industry standards. Overall, 6D unit provides an efficient and accurate solution for wafer testing and metrology. Its 5-axis wafer testing head offers unprecedented accuracy and repeatability, while the advanced closed-loop control machine ensures optimal results. Additionally, its range of imaging systems and software packages provide comprehensive analysis and reporting capabilities for full wafer quality control.