Used SEMILAB SCA-2500XP #9392132 for sale

ID: 9392132
Surface charge analyzer.
SEMILAB SCA-2500XP is a wafer testing and metrology equipment for semiconductor applications. It is renowned for its high precision measurement accuracy and versatile operation, making it an essential tool in the semiconductor industry. SCA-2500XP consists of three main components: a wafer holder, a wafer holding system, and a wafer testing apparatus. The wafer holder can be used to insert wafers of various sizes and thicknesses into the unit for testing, and is equipped with a loading mechanism and an integrated camera. The wafer holding machine uses vacuum-based clamping to secure the wafers for testing, ensuring that the wafers do not move during testing. The wafer testing apparatus consists of a stepper motor and a scanning microscopy unit. The stepper motor accurately maneuvers the microscope unit over the surface of the wafer, allowing precise measurement of the surface topography and other features of the wafer. SEMILAB SCA-2500XP also features a number of software tools that can be used to analyze and store data collected during testing. This includes a statistical data analysis package, which can be used to process and analyze the data, as well as a library for storing reference patterns. In addition, a comprehensive graphical user interface is provided to simplify operation. SCA-2500XP is designed with a range of safety features to protect users and their equipment. These include an optional interfacial protection module that can be used to check that the tool is functioning properly. This module also monitors the air conditions to ensure that appropriate levels of cleanliness are maintained at all times. The asset also features a number of physical safety features, such as light curtains to protect the user from any radiation, and a sealed lead shield to reduce the risk of exposure to hazardous materials. SEMILAB SCA-2500XP can be used for a range of applications, including surface measurements, topography analysis, structure measurements, and overlay and image analysis. It is perfectly suited for use in both research and manufacturing environments, and is easy to operate and maintain, making it an ideal solution for high-precision wafer testing and metrology.
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