Used SENSOFAR Plu Neox #293643177 for sale

SENSOFAR Plu Neox is a revolutionary wafer testing and metrology equipment that offers a comprehensive solution for the fast and efficient analysis of a wide range of wafer properties. It enables reliable determination of critical dimensions, bulk and thin film properties, and defects. The system utilizes a optical microscope to capture highly detailed images of the wafer, as well as a specialized dual laser detection configuration for improved accuracy when measuring features on micro-devices. The dual laser detection combines an infrared laser illuminator with an ultraviolet laser, allowing for precise detection and profiling of the wafer's physical and chemical surface topography - even when confined to inaccessible or recessed areas. In terms of metrology, Plu Neox uses a combination of automated visual inspection, multiple beam profilometry, and thickness measurements to detect and quantify wafer defects and analyze the critical dimensions of the wafer's surface topography. The precise metrology results, coupled with an advanced algorithm-based data analysis, enable the unit to accurately picture the invisible details of a wafer and determine whether it meets the quality and performance requirements of specified specification. SENSOFAR Plu Neox machine is also equipped with integrated, secure data management and reporting capabilities, allowing for traceability, reproducibility and easy archival of relevant wafer data in compliance with industry standards. Additionally, the tool includes a cloud-based user interface for interactive data review and exporting images. Finally, the device can be seamlessly integrated into a larger production monitoring asset, or can be used as a stand-alone device, due to its intuitive and user-friendly design. All of these features and capabilities make Plu Neox a top choice for any precision wafer testing and metrology requirements.