Used TAYLOR HOBSON PGI Dimension #293654943 for sale

ID: 293654943
Vintage: 2013
Optical profilometer 2013 vintage.
TAYLOR HOBSON PGI Dimension is a revolutionary wafer testing and metrology equipment that enables manufacturers to streamline their wafer testing process and improve performance. The system is adaptable and can be used for both in-line testing and off-line testing. The unit includes a high-accuracy positioner, a microdiffraction scanner, and a unique modular software package. The high-accuracy positioner uses interferometry to accurately measure the size and shape of the wafer, enabling manufacturers to carry out non-contact testing. The microdiffraction scanner scans the surface of the wafer and takes a detailed profile that can be used to detect defects or contamination. The machine can also measure thickness, refractive index, roughness, and other characteristics. The proprietary software can be configured to the user's needs and offers numerous analysis tools and visualization capabilities. The software can export test data to a range of standard formats, or generate customized reports. The tool can also interface directly with existing laboratory systems for data integration. The asset is also customizable for on-site installation and training, with limited to no disruption of normal production processes. An efficient user interface allows users to quickly customize the model to their needs and preferences. PGI Dimension equipment is an economical yet sophisticated solution that offers high-precision testing and metrology with shorter lead times. With its modular design and innovative features, it is an ideal solution for manufacturers looking to streamline their wafer testing process and reduce downtime.
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