Used VEECO / DIGITAL INSTRUMENTS Dimension VX 210 #9249370 for sale

VEECO / DIGITAL INSTRUMENTS Dimension VX 210 is a wafer testing and metrology equipment designed to provide users with fast and accurate data. It enables researchers to measure critical electrical and physical parameters on samples up to 8 inches in size. This innovative system features an automatic wafer handling unit, advanced imaging capabilities, and automated data acquisition. VEECO Dimension VX 210 utilizes its revolutionary Wafertool software to perform automatic wafer alignments and pattern recognition. It has a unique chuck aimed at ensuring precise measurements without any manual intervention. As a result, the machine minimizes errors and increases productivity. DIGITAL INSTRUMENTS DIMENSION VX210 also features a unique wafer flatness monitor which provides real-time visualization of the flatness or warped state of the wafer surface. This helps improve wafer quality and yield. In addition, it has advanced imaging capabilities provided by digital video microscope (DVM) for full-wafer, single-die, and cross-section measurements. This microscope has a magnification range of up to 600 times with a pixel resolution up to 1600 x 1200. DIGITAL INSTRUMENTS Dimension VX 210 is engineered to provide rapid and accurate visualization of sample features and materials. VEECO / DIGITAL INSTRUMENTS DIMENSION VX210 is powered by an advanced data acquisition tool capable of recording electrical, physical, and optical properties in real time. The asset is designed to run hundreds of concurrent tests and quickly export the data to other applications or databases. It also offers an internal database that can save test results for later review. Overall, DIMENSION VX210 is a next-generation wafer testing and metrology model that allows users to test and measure critical electrical and physical parameters. It is a comprehensive equipment with automated wafer handling, imaging capabilities, and data acquisition. Its Wafertool software ensures precise measurements with minimal errors and data errors. The system is ideal for research and development, device failure analysis, and reliability assurance.