Used VEECO / SLOAN V200-SL #293597629 for sale

VEECO / SLOAN V200-SL
ID: 293597629
Profiler.
VEECO / SLOAN V200-SL is a high-performance, ultra-high-resolution wafer testing and metrology equipment. This system is designed for precision testing and measurement of extremely tiny electronic components on semiconductor wafers and Film Frame materials, with a focus on high accuracy, resolution and speed. The unit is equipped with advanced high accuracy imaging, scanning and metrology capabilities to provide the best results for device inspection and metrology, featuring a 4 axis stage, laser interferometer and a precision microscope. VEECO V200-SL machine is designed with a 4 axis scanning stage, allowing for the automated testing of large area fields of view at high speeds. This stage features an X-Y-T translation stage, a precision rotary axis, and a 30-degree tilt option for angled testing and 3D measurements. The tool also includes an integrated laser interferometer for nanometer level accuracy and vibration-free stable operation. This feature also provides positional data with thermal stability, eliminating hysteresis errors over a wide range of temperatures. The asset utilizes a specialized and high-end optical microscope that offers a full range of capabilities and resolution. With the model's extended depth of field technology, users can easily inspect full area fields of view at high magnifications of up to 1500x. In addition, it includes the ability to measure surface topology using advanced white light interferometry. For analyzing devices on semiconductor wafers, SLOAN DEKTAK V-200 SL equipment is able to capture images of each device with an advanced CMOS imaging system and analyze them with user friendly software. The unit also features an integrated Autofocus Machine that allows for faster and more accurate measurements, as well as a reliable sample mapping capability for easy device recognition. VEECO DEKTAK V-200 SL is the perfect tool for precision testing and measurement of devices on semiconductor wafers. It offers nanometer level accuracy and resolution while providing stable operation, advanced optics and imaging capabilities, and easy to use software for image analysis. This asset provides users with the best results for their device inspection and metrology requirements.
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