Used GAERTNER L116S #9160082 for sale

GAERTNER L116S
Manufacturer
GAERTNER
Model
L116S
ID: 9160082
Ellipsometer 8" Capable PC controlled for measurement Laser wave length 632.8 nm (Helium-Neon - Red) Incidence angles: - 50 and 70 degree's Film thickness: 0 to 60,000 Angstroms Accuracy: +/-3 Angstroms (+/-0.3nm) Repeatability: +/- Angstrom (+/-0.1nm) Power = 110V.
GAERTNER L116S is a high-precision, handheld ellipsometer designed for quick and accurate material measurement. It provides precise characterization of mass and film layers down to 0.3 nanometer in thickness, with measurements being taken in just milliseconds. It is used in many industries, such as micro-electronics, optics, semiconductor, and others, to provide key measurements for product development, quality analysis, and other materials. GAERTNER L 116S uses the ellipsometer principle to measure the optical properties of a sample. This is done by shining a polarized light beam onto the sample and measuring the polarization change resulting due to it reflecting or refracting off the sample surface. This characterization done by the ellipsometer is very fast and accurate as it provides the amplitude and phase of reflected light, enabling the determination of sample refractive indices (RI), thickness, and other optical constants. L116S offers extensive features for its users. It is designed with an ergonomic user interface, which streamlines the setup and operation process. A large onboard display ensures clear reading, while the intuitive control buttons allow to quickly navigate and adjust settings. Its rotary control knob further adds to the ease of use by enabling quick changes of certain settings. For added convenience, the device is transportable and equipped with a USB port, allowing for quick connection to various computing devices. L 116S also provides highly accurate optical measurements, offering resolution of 0.003° and measurement noise below 0.015°. This is achieved through the use of a special 10-step filter wheel, ensuring that the measurements are precise and accurate. The ellipsometer also features an automated index corrector, allowing it to provide a precise index of a wide variety of materials. GAERTNER L116S is a highly reliable and accurate device for measuring optical properties of materials. Its intuitive user interface, transportability, and wide range of features makes it an ideal tool for professionals in many industries. It provides precise measurements of refractive indices, film thickness, and other optical constants, enabling quick analysis and efficient production.
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