Used GAERTNER L-26 #9026210 for sale

GAERTNER L-26 Ellipsometer is a sophisticated instrument designed for the measurement of the optical properties of thin films. Utilizing the polarized light of an infrared laser, the instrument is able to accurately measure the thickness, optical constants (refractive index and extinction coefficient), stress, topography, and other film characterizations of substrates in a non-destructive manner. The sensitive nature of the instrument allows it to measure thin films between 20Å and 60µm with sub-nanometer precision. L-26 consists of a laser source, a beam splitter, an optical fiber, a sample stage, and a detecting equipment. The laser source is a He-Cd laser operating in the Infrared range, emitting light at the wavelength of 441.6 nm. The beam splitter splits the laser beam into two beams, the s-polarized and the p-polarized, located at 90 degrees to each other. This light is then sent through a fiber optic cable and incident on the sample, typically using a 6° incidence. The sample is mounted on a motorized sample stage which is capable of angular positioning and z-axis displacement. Z-axis positioning allows for the measurement of films on various substrates in planar and non-planar configurations. The incident light polarized along the s- and p-axes is reflected from the sample surface, with the reflected beam containing polarized ellipsometric angles, measured by the analyzing system of GAERTNER L-26. This ellipsometric angle is then used to calculate the thickness, optical constants, stress and other film characteristics. L-26 also includes a rotating analyzer unit which provides two main capabilities. The first is dispersion measurements, which allows the ability to measure the dispersion of the refractive index for a sample at different time intervals over a wide range. The second capability of the machine is spectroscopic measurements, which provide information on the optical properties of a sample over a specific wavelength range. Overall, GAERTNER L-26 is an invaluable tool for determining the optical properties of various thin films and substrates. This high-precision tool has the ability to measure film thickness anywhere between 20Å and 60µm with sub-nanometer accuracy. L-26's rotating analyzer asset allows for dispersion and spectroscopic measurements, as well as aiding in further characterizations of properties like stress and topography.