Used GAERTNER L117-C #9004407 for sale

GAERTNER L117-C Ellipsometer is a equipment used to measure the optical properties of thin films on surfaces. The Ellipsometer uses two polarized light sources and a light detector to measure the polarization state of the light reflected off the surface being studied. The data collected from the reflected light can then be used to calculate the thickness, optical constants and deposition growth of the thin film material. L117-C Ellipsometer uses two internally stabilized He-Ne laser sources. The first laser is used as a reference, and is positioned perpendicularly to the light beam illuminating the sample. The second laser is used to measure the magnitude and polarization state of the elliptically polarized reflected light. The light detector is composed of two quadrant detectors that measure the magnitude and ratio of the polarization state. The data is then used to determine the resulting change in polarization which is affected by the properties of the thin film. This data can then be used to calculate the optical properties of the thin film, such as its thickness, refractive index and extinction coefficient. GAERTNER L117-C Ellipsometer is a reliable, repeatable and easy-to-use system for thin film analysis. It is a user friendly unit that can be controlled through an interactive graphical window and is suitable for research and development applications, or for routine quality control. It has an integrated computer unit, LCD touch-screen for data entry, and a fully automated sample handling unit for convenient measurements. In summary, L117-C Ellipsometer is a reliable and easy to operate machine used to measure the optical properties of thin films. It uses two lasers and a light detector to accurately measure the polarization state of the reflected light, allowing for the calculation of film thickness, refractive index and extinction coefficient. It is a user-friendly tool and is perfectly suited for research, development and routine quality control.