Used GAERTNER L2W16D.830 #9029443 for sale

GAERTNER L2W16D.830 is a precision scanning ellipsometer offering a reliable and easy-to-use optical equipment for characterizing thin film materials. The system uses a combination of wavelength and angle-resolved measurements to determine the true optical constants of thin films with ultimate accuracy. It supports data collection from both circular and linear polarizations, allowing comprehensive characterization of optical films such as metals, silicon, polymers, semiconductors and bio-materials. GAERTNER L2W16D.830 utilizes a dual wavelength HeNe laser source that delivers a wavelength of 632.8 and 543.5nm, optically coupled to a precision scanning mirror. It also incorporates an annular spot generator to create a line focus with a capacity of up to 5mm. This enables evaluation of larger surface areas within a single scan. An active control unit helps assure consistent and accurate scanning movement of the focusing optics. The optical machine of GAERTNER L2W16D.830 is designed for ease of use and allows for automated setup of measurement parameters such as spot size, vibration mode, and angle of incidence. An integrated diode array spectrometer provides wavelength resolution down to 0.5nm, and multiple measurements can be taken at each wavelength quickly and accurately. The tool is mounted on a stage which incorporates a computer-controlled XY-tripod, enabling rapid and precise positioning of the sample. GAERTNER L2W16D.830 is designed with an open, intuitive user interface that simplifies parameter adjustments and allows for easy data analysis on site. A range of optional software modules are available that provide support for data post-processing and professional report generation. In conclusion, GAERTNER L2W16D.830 offers comprehensive capabilities for optical characterization of thin and ultra-thin films with unsurpassed accuracy and resolution. With its automated setup, intuitive user interface and professional software modules, the asset is an ideal choice for the analysis of a wide range of materials.