Used ACCRETECH / TSK UF 3000EX #9189263 for sale

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Manufacturer
ACCRETECH / TSK
Model
UF 3000EX
ID: 9189263
Vintage: 2012
Prober Tri-temperature With hinged manipulator MHF4000EXC for ADVANTEST T2000 Cassette cover Includes: Hold material: SUS Wafer ID read: TYPE6 Ionizer: Standard (SUNX: ER-VS01) 2012 vintage.
ACCRETECH / TSK UF 3000EX is a PROber that combines optical inspection, voltage regulation and other advanced technologies for precision wafer testing. TSK UF3000EX features an unmatched accuracy of +/- 0.3 nm when inspecting the backside of the wafer. In addition to the extraordinary accuracies, ACCRETECH UF 3000 EX also offers quick probe time, low maintenance requirements and a host of other impressive features. ACCRETECH UF 3000EX is designed with a robust chassis and two independent probe arms. This two-arm design allows for both backside and frontside inspection of wafers at the same time. It is also capable of carrying up to two 8-inch wafers, allowing for accurate and efficient wafer testing. ACCRETECH / TSK UF 3000 EX uses optical inspection technology along with voltage regulation for precise wafer testing. The optical system consists of two cameras, one for the front side and one for the backside. These cameras measure the dimensions of each wafer and provide precise data regarding the position and shape of each wafer. In addition, the voltage regulation feature helps to ensure accuracy by ensuring that the applied voltage is the same across all layers of the wafer. This voltage regulation also helps to reduce errors that can occur as a result of inconsistent voltage levels. The accuracy of UF 3000EX is further enhanced by its advanced software. This software is capable of providing precise measurements within a tolerance of up to +/- 0.3 nm. Additionally, the software can provide real-time analysis and feedback on the quality of the test. This helps to ensure that wafers are tested to the highest of standards. TSK UF 3000 EX is an impressive prober that offers the highest level of accuracy, precise data analysis and fast probe times. This is well suited for a wide range of wafer testing applications such as design verification, manufacturing production, and debugging. Furthermore, its low maintenance requirements and wide availability make it an excellent cost-effective solution for many businesses.
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