Used ACCRETECH / TSK UF 3000EX #9180153 for sale

ACCRETECH / TSK UF 3000EX
Manufacturer
ACCRETECH / TSK
Model
UF 3000EX
ID: 9180153
Vintage: 2007
Prober Loader unit: Left side Barcode reader USB OCR: Auto wafer ID read Loader: FOUP, 12" Open, 12" Open, 8" Prober cleaning: Clean pad vacuum system Auto card change Chiller type: SCU-500R Test temp: ±1°C -40°C ~ 150°C Chiller: -40°C Cooling chuck Hinge: MHF4000EXC Max multi site: >256 Dies 2007 vintage.
ACCRETECH / TSK UF 3000EX is a prober used in the semiconductor industry for testing and inspecting the electrical characteristics of semiconductor components. This prober is designed with a high level of precision and accuracy, enabling it to quickly and accurately measure various parameters such as voltage and resistance on small integrated circuit (IC) components. TSK UF3000EX is equipped with a 10 x 10 mm field of view and a 2µm resolution. It has a built-in 2kV multi-stable impulse voltage generator that can generate high-powered voltage signals, allowing the prober to accurately measure low frequency characteristics such as amplifier parameters. The prober also comes equipped with the industry's best capacitance measurement system that can measure up to 101 pF range on resistors and capacitors. ACCRETECH UF 3000 EX is driven by a Windows-based software system, which offers a variety of features and functions. It is designed to integrate with other measurement and automation equipment, allowing for a flexible and efficient workflow. The software system can be tailored to user-specific needs, and it can be updated regularly with the latest features and functions. UF 3000 EX is made of high quality materials and components, providing reliable and long-lasting performance. It comes with a 2 year limited warranty, and it is safety certified by TUV. This prober is well-suited for use in production, research, development, and quality control environments. TSK UF 3000 EX is available with a variety of options and accessories, making it ideal for both basic and advanced testing requirements.
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