Used ADVANTEST T 5501 #9193165 for sale

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ADVANTEST T 5501
Sold
Manufacturer
ADVANTEST
Model
T 5501
ID: 9193165
Memory tester.
ADVANTEST T 5501 Final Test Equipment is a high-performance, automated test solution dedicated to wafer-level device testing. The system offers high speed, wafer-level testing for a variety of semiconductor devices and ICs. T 5501 utilizes a state-of-the-art testing head to quickly and accurately sample devices from chips, wafers and other substrates. The unit allows for testing of small to large devices with high yield, making it an ideal choice for high-speed wafer-level testing for advanced semiconductor products. The main features of ADVANTEST T 5501 Final Test Machine include: High-speed testing of devices from chips, wafers and other substrates. High test yield and accuracy, with auto-correction of test results. Multipurpose testing of small to large devices with customizable configurations. In-tool programming and configuration to support a variety of test conditions. Broad range of supported packaging and devices. Modular design for easy maintenance and upgrades. Robust support for multiple test requirements. T 5501 offers a range of high-performance testing capabilities, enabling the testing of a wide selection of products at high speed. The asset's modular design makes it easy to adjust and customize the test environment to support a variety of test requirements. Additionally, the model offers advanced features, such as automated troubleshooting, an integrated test analyzer, and advanced memory testing, which enhances the process of producing reliable and compliant devices. ADVANTEST T 5501 Final Test Equipment is a powerful, versatile solution for high-speed testing of semiconductor chips and devices. The system provides high test accuracy, reliability and yield, making it an ideal choice for production and development benefit. With a broad range of supported packaging and devices, and a modular design for easy maintenance and upgrades, T 5501 unit is a proven and reliable choice for high-speed, wafer-level testing.
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