Used THERMA-WAVE TP 420 #9187284 for sale

THERMA-WAVE TP 420 Wafer Testing and Metrology Equipment is a next-generation, leading-edge tool designed to deliver reliable and accurate results for analysis and inspection of semiconductor wafers. This system's state-of-the-art technology provides highly precise 3-dimensional data on a variety of dimensions and attributes, which can be used for real-time metrology and direct 3-dimensional defect maps. TP 420 is ideal for a variety of wafer sizes, ranging from 300-millimeter to 8-inch wafers. It is equipped with state-of-the-art optics, allowing for the dimensional characterization of features as small as 150 nanometers with sub-nanometer resolution. A key feature of the unit is its software that includes a high-level of advanced parameterization, minimization of defect scattering and an intuitive graphical user interface. This machine provides efficient data collection with unlimited customization options, ensuring accurate alignment of the optical tool and calibration of critical parameters during data acquisition. THERMA-WAVE TP 420 also features ultrasonic sensors to detect defects on a bulk basis. The ultrasonic sensors provide a preview of the total number of defects per wafer. This ensures that both the testers and operators have the ability to compare their results with complete accuracy to the previously acquired results. Furthermore, the ultrasonic sensors can detect multiple types of defects at the same time, such as micron-sized cracks, tower defects, slag and grains. In addition to its advanced metrology capabilities, TP 420 provides a comprehensive suite of wafer testing capabilities for wafer production and process development. It is able to detect a variety of different types of defects both on a macro and a micro-level, from pattern defects to contamination on contact surfaces. The asset can also detect scratches, scratches in depth, ringing, entombment, and poor electrical contact, ensuring that the end product is defect-free. Finally, THERMA-WAVE TP 420 can be integrated into existing production systems, providing fast and accurate results within the workflow. In addition, the model is designed for easy maintenance and scalability. Its modular design allows for the upgrading of its technology as needed, ensuring that it keeps up with the changing requirements of the industry. Overall, TP 420 Wafer Testing and Metrology Equipment offers a comprehensive set of features and capabilities that ensures reliable and accurate results, allowing customers to receive defect-free product. This system offers a complete solution for wafer testing and metrology needs, which makes it the ideal choice for wafer production and process development.