Used PHILIPS / FEI Nova NanoLab 200 #9081351 for sale

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ID: 9081351
Vintage: 2004
Focused ion beam system Electron and ion beams: Yes (2) Gas injection systems: PT, unlabeled Detectors: Secondary Backscatter Chamberscope Main instrument: Semiconductor Stage tilt: Yes Rotation capability: 45° or more Features / addons: Micromanipulator Second gas: Ins 2004 vintage.
PHILIPS / FEI Nova NanoLab 200 is a scanning electron microscope (SEM) designed for the imaging and analysis of the nanoscale structures of a variety of materials. It is equipped with a 3-axis precision stage, giving it the ability to move up to three axes simultaneously for precise sample positioning. In addition, the microscope is capable of providing high resolution imaging of surfaces with a lateral resolution of 0.5 nm and a vertical accuracy of 0.3 nm. FEI Nova NanoLab 200 incorporates advanced automated imaging and analysis software which enables users to capture and analyze images quickly and accurately. It is also built with a highly-efficient electron gun, which produces high intensity beams of electrons for imaging surfaces down to the atomic level. This electron gun is designed to minimize the effects of charging due to electron-beam interaction with the sample. PHILIPS Nova NanoLab 200 also includes an automated sample excitation system which controls the magnitude and direction of the beam to optimize image contrast for a wide range of applications. It is also equipped with a wide variety of software packages to assist with all aspects of sample preparation, analysis, and conditions optimization. Nova NanoLab 200 also utilizes sophisticated computerized scanning operations via its integrated dedicated motorized scanner. This system allows for automated scanning along all axes of the sample as well as the ability to control the exposure time and brightness of the electron beam, critical components of imaging success for the successful operation of the microscope. Finally, PHILIPS / FEI Nova NanoLab 200 has a broad range of accessories designed to enhance the user's experience. These accessories include a microscope controller to simplify image capture, an image analysis program to quickly analyze image data, and a variety of manipulators designed to help manipulate the environment of the specimen, such as holder, coverslips, specimen holders, and vapor pressure manipulators. All-in-all, FEI Nova NanoLab 200 is an excellent choice for studying nanoscale structures and materials due to its sophisticated scanning electron microscope. It offers a high level of accuracy, an advanced automated imaging and analysis system, and a wide variety of tools and accessories for optimized operation. With its versatility and affordability, it is an ideal choice for any researcher.
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