Used ACCRETECH / TSK Win-Win 50-A5000 #9178343 for sale

ACCRETECH / TSK Win-Win 50-A5000 is a mask and wafer inspection equipment designed to help reduce product defects. It enables the detection of anomalies in pattern alignment and overlay of masks and wafers to within 7 nanometers. This allows for fast and reliable production inspection. The system is able to detect defects such as repeating errors, contact issues, or defects leading to yield issues. It also helps to detect pattern alignment errors in far field focal points below one nanometer. The unit features an integrated beam tilt monitor so that all measurement results are traceable to the same origin. This ensures consistent inspection even when measuring multiple wafers. TSK Win-Win 50-A5000 has an integrated image analysis capability that makes it easy to compare measured images with target images to quickly detect defects. It also features a step and repeat image capture option that enables high-speed repeatable measurements. The machine has a fast laser autofocusing tool that helps to maintain imaging accuracy. It also has a sophisticated in-chamber integrated camera that captures images in real time. ACCRETECH Win-Win 50-A5000 allows several measurements to be performed simultaneously on a single wafer, helping to reduce production cycle times and improve process efficiency. It has an advanced illumination asset that helps to reduce the amount of time required to make measurements. The model is also compatible with several industrial standard software platforms, which helps to make it even more efficient. It is also flexible and scalable, allowing it to fit within any size manufacturing environment. Overall, Win-Win 50-A5000 mask and wafer inspection equipment is an extremely reliable and efficient tool that helps to reduce production defects while also improving manufacturing efficiency. It is an invaluable addition to any manufacturing process.