Used ACCRETECH / TSK Win-Win 50-A5000 #9178496 for sale

ACCRETECH / TSK Win-Win 50-A5000 Mask & Wafer Inspection Equipment is a comprehensive, high-precision tool designed to provide a comprehensive solution for inspecting semiconductor mask and wafer defects. The system is designed to be robust and reliable, offering a high level of accuracy and reliability. It provides a comprehensive set of features that help to diagnose any type of mask, wafer, or opto-electronic device defects. The unit utilizes an advanced inspection technology that combines a microscopy imaging machine with focused ion beam and atomic force microscopy techniques. This integration allows for a much higher level of detail in the analysis of structures down to nanometer levels, as well as detection of non-visible defects or deformations. The imaging tool is composed of a designable scan area, with optical and X-ray capability, as well as automatically adjusting fields of view. The asset also offers advanced SEM/FIB imaging with parallel imaging model and automated stitching feature for seamless picture staining, making it ideal for returning extensive digital images of complex or difficult defects. TSK Win-Win 50-A5000 is equipped with a high-precision scan accuracy, making it suitable for rigorous quality control and production duties. It also has an automated and highly precise alignment equipment which, coupled with a matching image acquisition feature, allows for the detection of very small deformations in the mask or wafer shape. This system can accurately read the etch silhouette, etch angle, and etch sinkage. Additionally, the unit is able to accurately and quickly detect any structural anomalies in the mask or wafer, such as defects, cracks, and non-uniform shapes. Furthermore, ACCRETECH Win-Win 50-A5000 offers a wide range of powerful built-in tools to help simplify mask and wafer defect detection and analysis. This includes a suite of user-friendly scan and data comparison features, as well as a comprehensive set of software tools for preparing and transferring data across network connections. Additionally, the built-in Optical Scattering and Reflection (OSR) detectors offers various modes of operation, helping to identify and distinguish even the tiniest defects from smooth surfaces. Overall, Win-Win 50-A5000 Mask & Wafer Inspection Machine offers a powerful package of features and capabilities, enabling users to identify and address virtually any kind of semiconductor mask or wafer defects with the highest levels of accuracy and reliability. The tool is optimized for use in both R&D and production environments, ensuring maximum productivity, cost-efficiency, and quality assurance.